Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
Boron Nitride Nanotube Growth Mode
27 Jan 2012 | Publications | Contributor(s): Brian Demczyk
This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques.
This research was supported in part by the Director of the Office of …
Boron Nitride Nanotube Structure
07 Oct 2011 | Publications | Contributor(s): Brian Demczyk, J. Cumings, A. Zettl
We have used high-resolution transmission electron microscopy to resolve the basal plane structure and chirality relationships in boron nitride nanotubes.
Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)
07 Oct 2011 | Publications | Contributor(s): Brian Demczyk, R. Naik, G. Auner, C. Kota, U. Rao
Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.