Simulation and Admittance Analysis for Advanced Metal-Insulator-Semiconductor Characterization
23 Feb 2014 | Tools | Contributor(s): Alex Grede
Non-parabolic DOS simulation of III-V MISCAPs with impurity ionization effects and ability to view components of channel capacitance.
III-V Strain Compensation Calculator
08 Feb 2015 | Tools | Contributor(s): Stephen Polly, Alex J Grede
Calculate required thickness of strain compensation for quantum dots or quantum wells in the III-V material system.
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