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Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.

Table 1: Overview
Item Value
Contributions: 6
Total Simulation Users Served: 403
Total "and more" Users Served: 1,994
Rank by Contributions: 164 / 1560
First Contribution: 28 Aug 2006
Last Contribution: 30 Sep 2011
Citations on Contributions: 5
Usage in Courses/Classrooms: 63 users served in 8 courses from 4 institutions
Table 2: Simulation Tool Usage
# Tool Name Users served in last 12 months Simulation Runs in last 12 months Total users served Total Simulation Runs Citations Published On
1 Modeling Interface-defect Generation (MIG) 61 2,587 546 7,545 3 28 Aug 2006
TOTAL 61 2,587 403 7,545
Table 3: "and more" Usage
# Resource Title Users served in last 12 months Total users served Citations Published On
1 Theory and characterization of random defect formation and its implication in variability of nanoscale transistors Papers 127 672 - 30 Sep 2011
2 Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations 137 723 2 02 May 2011
3 Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors Online Presentations 26 289 - 31 Dec 2009
4 On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations 44 493 - 30 Dec 2009
5 Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations 7 198 - 01 Jul 2008
TOTAL 320 1,994
* Total only includes versions of the tools this author contributed to.

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.