nMOSFET RF and noise model on standard 45nm SOI technology 1.0.0
A compact scalable model suitable for predicting high frequency noise and nonlinear behavior of N-type Metal Oxide Semiconductor (NMOS) transistors is presented.
Listed in Compact Models
Additional materials available
Version 1.0.0 - published on 05 Jan 2017 doi:10.4231/D3833N04K - cite this
Licensed under NEEDS Modified CMC License according to these terms
Reviews
No reviews found. Be the first to review this resource!