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Multi-walled/Single-walled Carbon Nanotube (MWCNT/SWCNT) Interconnect Lumped Compact Model Considering Defects, Contact resistance and Doping impact
2018-07-18 16:10:04 | Compact Models | Contributor(s): Rongmei Chen, Jie LIANG, Jaehyun Lee, Vihar Georgiev, Aida Todri | doi:10.4231/D3183448N
In this project, we present SWCNT and MWCNT interconnect compact models. These models consider the impact of CNT defects, the chirality and contact resistance between CNT-electrode (Pd) on CNT interconnect performances and power consumption. Variabilities
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