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  1. MIT TFET compact model including the impacts of non-idealities

    MIT TFET compact model including the impacts of non-idealities

    2017-05-08 02:34:24 | Compact Models | Contributor(s): Redwan Noor Sajjad, Ujwal Radhakrishna, Dimitri Antoniadis | doi:10.4231/D3XW47X6W

    We present a compact model for tunnel FET that for the first time fits experimental transfer and output characteristics including the impact of non-idealities such as trap assisted tunneling and intrinsic band steepness.