Support

Support Options

Submit a Support Ticket

 

Illinois Nano EP Seminar Series Spring 2010 - Lecture 3: Characterization and Modeling of Transport in Single Walled Carbon Nanotube Films for Device Applications

By Ashkan Behnam

University of Florida

Published on

Abstract

Single‐walled carbon nanotube (CNT) films are transparent, conductive, and flexible materials. These films have uniform physical and electronic properties, and can be mass produced in a cost effective manner. Due to these favorable properties, they have been suggested for various applications such as flexible microelectronics, optoelectronic and photovoltaic devices, supercapacitors and chemical sensors. However, the percolative electronic transport phenomena in these films have not been thoroughly studied. In addition, for applications such as solar cells and photodetectors, the interface between the CNT film and the host material needs to be analyzed as it plays a significant role in determining the transport mechanisms and device characteristics. In this talk, we will
discuss our experimental and computational results on CNT film resistivity and 1/f noise scaling with device parameters. Then, we will analyze a metal‐semiconductor photodetector with CNT film as the metal and Si as the semiconducting substrate.

Submitter

Omar N Sobh

University of Illinois at Urbana-Champaign

Bio

Post�doctoral Candidate, Pop Lab Dept. of Electrical and Computer Engineering, University of Florida

Cite this work

Researchers should cite this work as follows:

  • Ashkan Behnam (2011), "Illinois Nano EP Seminar Series Spring 2010 - Lecture 3: Characterization and Modeling of Transport in Single Walled Carbon Nanotube Films for Device Applications," https://nanohub.org/resources/10569.

    BibTex | EndNote

Tags

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.