Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

By Souvik Mahapatra

Electrical Engineering, IIT Bombay, Mumbai, India


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    4.0 out of 5 stars

    The material and content presented is very well prepaired but the pace of presentation should be less.

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