Origin of the orientation ratio in sputtered longitudinal media

By Brian Demczyk1, J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen

1. None

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Abstract

The surface morphology, thin film microstructure, and crystallography of sputtered longitudinal
media were examined by atomic force and transmission electron microscopy.

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Researchers should cite this work as follows:

  • Brian Demczyk; J. N. Zhou; G. Choe; E. Stach; E. C. Nelson; U. Dahmen (2011), "Origin of the orientation ratio in sputtered longitudinal media," https://nanohub.org/resources/12239.

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