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By Kyle Christopher Smith1, David A Saenz1, Dmitry Zemlyanov1, Andrey A Voevodin2
1. Purdue University 2. Air Force Research Laboratory
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
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Version 3.11 - published on 15 Sep 2014
doi:10.4231/D3FJ29D7X cite this
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