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XPS Thickness Solver

By Kyle Christopher Smith1, David A Saenz1, Dmitry Zemlyanov1, Andrey A Voevodin2

1. Purdue University 2. Air Force Research Laboratory

Helps the user to determine the thickness of an overlayer material from XPS experiment data.

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Version 3.11 - published on 15 Sep 2014

doi:10.4231/D3FJ29D7X cite this

This tool is closed source.

View All Supporting Documents, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.