XPS Thickness Solver

By Kyle Christopher Smith1; David A Saenz1; Dmitry Zemlyanov1; Andrey A Voevodin2

1. Purdue University 2. Air Force Research Laboratory

Helps the user to determine the thickness of an overlayer material from XPS experiment data.

Launch Tool

This tool version is unpublished and cannot be run. If you would like to have this version staged, you can put a request through HUB Support.

Archive Version 3.0
Published on 04 Jun 2012 All versions

doi:10.4231/D3N29P603 cite this

This tool is closed source.

Category

Tools

Published on

Abstract

This tool was developed mainly to provide a quick analysis resource for XPS experiments involving graphene flakes or films of different thicknesses. Given sets of data from the experiment as indicated in the manual for this tool, it can provide the number of monolayers not only for graphene flakes, but other thin film materials.

Powered by

Network for Computational Nanotechnology (NCN), Birk Nanotechnology Center, Purdue University.

Credits

Kyle C. Smith, David Saenz, Dmitry Zemlyanov, Andrey A. Voevodin, Gerhard Klimeck

Sponsored by

Purdue Network for Computational Nanotechnology.

References

C. S. Fadley. Basic Concepts of X-Ray Photoelectron Spectroscopy, C. J. Powel and A. Jabolonsky. NIST Electron Inelastic Mean Free Path Database, CasaXPS.com

Publications

XPS Measurements of Graphene Film Thickness, submitted (2012).

Cite this work

Researchers should cite this work as follows:

  • RAPPTURE, NIST Database #71 and #82, CasaXPS. Refer to manual for detailed citations.

  • Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey A Voevodin (2014), "XPS Thickness Solver," https://nanohub.org/resources/xpsts. (DOI: 10.4231/D3N29P603).

    BibTex | EndNote

Tags

  1. characterization
  2. materials science
  3. nanoelectronics
  4. nanomaterials
  5. photoelectric effect
  6. surface science
  7. X-Ray Photoelectron Spectroscopy (XPS)