Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
By Souvik Mahapatra
Electrical Engineering, IIT Bombay, India
28 Mar 2012
Researchers should cite this work as follows:
Souvik Mahapatra (2012), "Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)," https://nanohub.org/resources/13614.