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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

By Souvik Mahapatra

Electrical Engineering, IIT Bombay, India

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Additional materials available (2)

Supporting Docs

(HTML5)Presentation (with audio)
(PDF, 1.34 MB)Presentation Slides