VEDA: Virtual Environment for Dynamic AFM

A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.

Launch Tool

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Archive Version 2.1.12
Published on 31 Oct 2014 All versions

doi:10.4231/D32R3NX9S cite this

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Tools

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Abstract

VEDA is a suite of tools for simulating many different aspects of dynamic AFM under a range of operating modes and environments. VEDA consists of four tools: Dynamic Approach Curves tool: accurately simulates an AFM cantilever excited at resonance and brought towards a sample surface. Two version are available: basic and advanced. The basic tool simulates oscillations of a single eigenmode of the cantilever, while the advanced tool simulates multiple eigenmodes and multiple excitation frequencies. Amplitude Modulated Scanning tool:simulates amplitude modulated scans over specified geometric features with heterogeneous material properties. This tool accurately simulates surface scans performed by an AFM probe controlled by amplitude modulation. Both basic and advanced versions of this tool are also available, corresponding to the same feature sets as the Dynamic Approach Curves tools. F-Z Curves tool: simulates the response of an undriven microcantilever approaching or retracting from a sample. This tool is useful for observing bi-stabilities in equilibria and the related ``snap-in'' and ``pull-off'' phenomena Frequency Sweep tool: simulates the nonlinear response of a driven cantilever swept across resonance. Simulations of single or multiple eigenmodes are possible. All of the VEDA tools include a variety of different tip-sample interaction models including DMT, JKR, and Hertz, as well as capillary and viscoelastic forces.

Sponsored by

  • Network for Computational Nanotechnology (NCN)
  • National Science Foundation (NSF)
  • Dow Chemical Corporation

Publications

D. Kiracofe, J. Melcher & A. Raman, "Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator" Review of Scientific Instruments, 83, 013702 (2012). J. Melcher, S. Hu, & A. Raman, "VEDA: A web-based virtual environment for dynamic atomic force microscopy" Review of Scientific Instruments 79, 061301 (2008).

Cite this work

Researchers should cite this work as follows:

  • Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu (2022), "VEDA: Virtual Environment for Dynamic AFM," https://nanohub.org/resources/veda. (DOI: 10.4231/D32R3NX9S).

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Tags

  1. atomic force microscopy (AFM)
  2. materials science
  3. microscopy
  4. NCN Group - Characterization and Metrology
  5. VEDA - Virtual Environment for Dynamic AFM