Support Options

Submit a Support Ticket


On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

By Brian Demczyk


Published on


This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by transmission electron microscopy and atomic force microscopy.


Recording media were fabricated and atomic force microscopy performed at the Maxtor San Jose, CA facility (now closed). Transmission electron microscopy was carried at at the National Center for Electron Microscopy at the Lawrence Berkeley national Laboratory, Berkeley, CA.

Tags, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.