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Modeling Interface-defect Generation (MIG)
Analyzes device reliability based on NBTI
Supporting Docs
- (PDF, 166.74 KB) MIG_Manual.pdf
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Analyzes device reliability based on NBTI
You must login before you can run this tool.
Version 2.1 - published on 22 Jan 2014
doi:10.4231/D3FQ9Q555 cite this
This tool is closed source.