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Home › Tools › Modeling Interface-defect Generation (MIG) › Supporting Docs

Modeling Interface-defect Generation (MIG)

By Ahmad Ehteshamul Islam¹, HALDUN KUFLUOGLU¹, Muhammad Alam¹

1. Purdue University

Analyzes device reliability based on NBTI

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Version 2.1 - published on 22 Jan 2014

doi:10.4231/D3FQ9Q555 cite this

This tool is closed source.

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Supporting Docs

(PDF, 166.74 KB) MIG_Manual.pdf