ECE 695A Lecture 1: Reliability of Nanoelectronic Devices

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Evolving Landscape of Electronics
  • Performance, Variability, and Reliability
  • Classification of Reliability
  • Course Information
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 1: Reliability of Nanoelectronic Devices," https://nanohub.org/resources/16511.

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Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

ECE 695A Lecture 1: Reliability of Nanoelectronic Devices
  • Lecture 1: Reliability of Nanoelectronic Devices 1. Lecture 1: Reliability of Nano… 0
    00:00/00:00
  • copyright 2013 2. copyright 2013 25.492158825492158
    00:00/00:00
  • Outline of lecture 1 3. Outline of lecture 1 60.960960960960961
    00:00/00:00
  • Technology & transistors in electronics 4. Technology & transistors in el… 185.25191858525193
    00:00/00:00
  • Landscape of electronics in evolving 5. Landscape of electronics in ev… 428.26159492826162
    00:00/00:00
  • Evolution in microelectronics 6. Evolution in microelectronics 670.43710377043715
    00:00/00:00
  • Evolution in large area electronics 7. Evolution in large area electr… 955.92258925592262
    00:00/00:00
  • Outline 8. Outline 1132.2322322322323
    00:00/00:00
  • Uniformity of Components in Systems 9. Uniformity of Components in Sy… 1134.5011678345013
    00:00/00:00
  • Process, reliability, and design 10. Process, reliability, and desi… 1339.5395395395397
    00:00/00:00
  • Process variations in scaled transistors 11. Process variations in scaled t… 1439.2392392392394
    00:00/00:00
  • Solar cells and display electronics 12. Solar cells and display electr… 1631.3646980313647
    00:00/00:00
  • Process variation: thin film transistors 13. Process variation: thin film t… 1685.251918585252
    00:00/00:00
  • Flexible nanonet electronics 14. Flexible nanonet electronics 1774.9082415749083
    00:00/00:00
  • Reliability: time dependent degradation 15. Reliability: time dependent de… 1833.1998665331998
    00:00/00:00
  • Time dependent dielectric breakdown 16. Time dependent dielectric brea… 1996.7967967967968
    00:00/00:00
  • Reliability: correlation, power-laws, contacts 17. Reliability: correlation, powe… 2131.0977644310979
    00:00/00:00
  • Equivalence between variability & reliability 18. Equivalence between variabilit… 2237.3707040373706
    00:00/00:00
  • Outline 19. Outline 2316.6833500166836
    00:00/00:00
  • Reliability of nanotransistors 20. Reliability of nanotransistors 2318.7854521187855
    00:00/00:00
  • Scaling and reliability: A short history 21. Scaling and reliability: A sho… 2433.1664998331667
    00:00/00:00
  • Reliability and bonding 22. Reliability and bonding 2649.6162829496166
    00:00/00:00
  • Outline 23. Outline 2706.1061061061064
    00:00/00:00
  • Course Information 24. Course Information 2717.7177177177177
    00:00/00:00
  • Reference books 25. Reference books 2871.4381047714382
    00:00/00:00
  • Conclusions 26. Conclusions 2961.6950283616952
    00:00/00:00