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ECE 695A Lecture 13: Introductory Lecture on HCI Degradation

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on



  • Background and features of HCI Degradation
    • Phenomenological observations
    • Origin of Hot carriers
  • Theory of Si-H Bond Dissociation
  • Theory of Si-O Bond Dissociation
  • Conclusions



EE 226, Purdue University, West Lafayette, IN

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