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ECE 695A Lecture 15: Off-state HCI Degradation

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • ON vs. OFF State HCI Degradation
  • Origin of hot carriers at off-state
  • SiH vs. SiO – who is getting broken? Voltage acceleration factors by scaling
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 15: Off-state HCI Degradation," https://nanohub.org/resources/16919.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

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