Support Options

Submit a Support Ticket


ECE 695A Lecture 16: Temperature Dependence of HCI

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on



  • Empirical observations regarding HCI
  • Theory of bond dissociation: MVE vs. RRK
  • Hot carrier dissociation of SiH bonds
  • Hot carrier dissociation of SiO bonds
  • Conclusions



EE 226, Purdue University, West Lafayette, IN

Tags, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.