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ECE 695A Lecture 15R: Review Questions

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Review Questions:

  1. Why is BTBT tunneling important for OFF-state HCI, but nor for ON-state HCI?
  2. What type of bond dissociation dominated DeMOS degradation? Provide two supporting arguments.
  3. Will universality hold of SiH and SiO bond dissociation occur in equal proportion?
  4. Do you expect NBTI to be described by universal voltage and temperature scaling? What if electron/hole trapping is present?
  5. Support the argument that scaling hypothesis is theory-agnostic, and therefore once empirically demonstrated, is more powerful.

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 15R: Review Questions," https://nanohub.org/resources/16933.

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EE 226, Purdue University, West Lafayette, IN

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