ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Importance of measuring interface damage
  • Electronic Spin Resonance ( A quick review)
  • Spin Dependent Recombination
  • Electrically detected spin-resonance and noise- spectroscopy
  • Comparing the approaches
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance," https://nanohub.org/resources/17024.

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Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. reliability
  3. nanoelectronics
  4. spin
  5. magnetic resonance