ECE 695A Lecture 30: Breakdown in Dielectrics with Defects

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Introduction
  • Theory of pre-existing defects: Thin oxides
  • Theory of pre-existing defects: thick oxides
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 30: Breakdown in Dielectrics with Defects," https://nanohub.org/resources/17486.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

ECE 695A Lecture 30: Breakdown in Dielectrics with Defects
  • Lecture 30: Breakdown in Dielectrics with Defects 1. Lecture 30: Breakdown in Diele… 0
    00:00/00:00
  • copyright 2013 2. copyright 2013 83.049716383049713
    00:00/00:00
  • Outline 3. Outline 83.583583583583589
    00:00/00:00
  • Theory vs. experiment: large bandgap solids 4. Theory vs. experiment: large b… 219.35268601935269
    00:00/00:00
  • Damaged by plasma etching 5. Damaged by plasma etching 294.6946946946947
    00:00/00:00
  • Damage during electrostatic discharge (nonequilibrium pre-existing defects) 6. Damage during electrostatic di… 636.20286953620291
    00:00/00:00
  • Breakdown with preexisting defects 7. Breakdown with preexisting def… 875.74240907574244
    00:00/00:00
  • Breakdown with preexisting defects 8. Breakdown with preexisting def… 1300.0667334000668
    00:00/00:00
  • Outline 9. Outline 1879.87987987988
    00:00/00:00
  • Background: Analogy to Fracture Mechanics 10. Background: Analogy to Fractur… 1887.1538204871538
    00:00/00:00
  • Pre-existing defects, field enhancement, and breakdown in thick insulators (e.g. polymers) 11. Pre-existing defects, field en… 2086.9536202869535
    00:00/00:00
  • Defects and fields … 12. Defects and fields … 2199.9332665999332
    00:00/00:00
  • Analogy to resistor network 13. Analogy to resistor network 2497.3973973973975
    00:00/00:00
  • Small-cluster size distribution 14. Small-cluster size distributio… 2578.2782782782783
    00:00/00:00
  • Size distribution and critical defect size 15. Size distribution and critical… 2850.1835168501834
    00:00/00:00
  • Breakdown field for islands of size Lc 16. Breakdown field for islands of… 2979.3793793793793
    00:00/00:00
  • VBD distribution close to percolation threshold 17. VBD distribution close to perc… 3133.7003670337003
    00:00/00:00
  • Size distribution at percolation threshold 18. Size distribution at percolati… 3302.1021021021024
    00:00/00:00
  • Distributed failure probabilities 19. Distributed failure probabilit… 3425.4254254254256
    00:00/00:00
  • What does it all mean (ramp voltage tests) ? 20. What does it all mean (ramp vo… 3536.0026693360028
    00:00/00:00
  • Conclusions 21. Conclusions 3674.9416082749417
    00:00/00:00
  • References 22. References 3792.2922922922926
    00:00/00:00