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Semiconductor Device Fundamentals Testbook Module B: Diode Basics

By Robert F. Pierret

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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This is module B (part 2) of the Testbook for Semiconductor Device Fundamentals. The tests, given over a number of years, are arranged in reverse time order, with the latest tests appearing first. A sheet containing key equations and numerical information was typically provided during closed book tests. A set of info/equation sheets is included before the first test. Test page numbers are of the form…(module)(test number)-N… to provide ready access to a given test. A title sheet precedes each test noting the module designation (A, B, or C), the test number (A2, B5, etc.), whether the test is open or closed book, a reminder that info/equation sheets are available for use with closed book tests, and problem weighting information.

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Researchers should cite this work as follows:

  • Robert F. Pierret (2013), "Semiconductor Device Fundamentals Testbook Module B: Diode Basics ,"

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Purdue University, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.