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Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

By Brian Demczyk1, R. Naik2, A. Lukaszew, G. W. Auner2, V. M. Naik3

1. None 2. Wayne State university 3. University of Michigan, Dearborn, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.