You must login before you can run this tool.
Varghese, D., et al. "OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review." Microelectronics Reliability (2014).
Varghese, D., et al. "A comprehensive analysis of off-state stress in drain extended PMOS transistors: Theory and characterization of parametric degradation and dielectric failure." Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. IEEE, 2008.