[Illinois] Advanced Materials Characterization Workshop 2015

By Ted Limpoco1, Scott Speakman2, Timothy P. Spila3, Rick Haasch3, Justin Masone4, Kathy Walsh3, Matthew Bresin3

1. Asylum Research and Oxford Instruments 2. PANalyitical, Inc. 3. University of Illinois at Urbana-Champaign 4. Shimadzu Scientific Instruments

In This Workshop

  1. [Illinois] Quantitative Elastic Measurements of High Modulus Materials with Tapping/AM-FM Mode

    18 Aug 2015 | Online Presentations | Contributor(s): Ted Limpoco

  2. [Illinois] Rutherford Backscattering Spectroscopy

    18 Aug 2015 | Online Presentations | Contributor(s): Timothy P. Spila

  3. [Illinois] Introduction to Elemental Analysis by ED-XRF

    18 Aug 2015 | Online Presentations | Contributor(s): Justin Masone

  4. [Illinois] Nano- and Micromechanics

    18 Aug 2015 | Online Presentations | Contributor(s): Kathy Walsh

  5. [Illinois] An Introduction to Scanning Electron Microscopy and Focused Ion Beam

    18 Aug 2015 | Online Presentations | Contributor(s): Matthew Bresin

  6. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1

    18 Aug 2015 | Online Presentations | Contributor(s): Rick Haasch

  7. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2

    18 Aug 2015 | Online Presentations | Contributor(s): Rick Haasch

  8. [Illinois] Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer

    18 Aug 2015 | Online Presentations | Contributor(s): Scott Speakman

  9. [Illinois] Secondary Ion Mass Spectroscopy

    18 Aug 2015 | Online Presentations | Contributor(s): Timothy P. Spila