8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015

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Abstract

Variability has emerged as a fundamental challenge to IC design in scaled CMOS technology; and it has profound impact on nearly all aspects of circuit performance. While some of the negative effects of variability can be handled via improvements in the manufacturing process, comprehensive methods are necessary to assess and manage the negative effects of variability, which in turn requires accurate and tractable variability models. The goal of the VMC workshop is to provide a forum for theoreticians and practitioners to freely exchange opinions on current practices as well as future research needs in variability modeling and characterization. The 2015 VMC was co-organized with NSF-SRC NEEDS.

Programs of VMC workshops are available: 2015, 2014, 2013, 2012, 2011, 2010, 2009, 2008

Key Topics covered in the workshop:

  • Physics mechanisms and technology trends of device-level variations
  • First-principles simulation methods for predicting variability
  • Time-dependent variation and their interaction with other variation sources
  • Compact modeling of variations in devices and interconnect
  • Device and circuit level modeling techniques
  • Test structure design for variability
  • Design interface with manufacturing and solutions for variability
  • Variability characterization, bounding and extraction
  • Statistical data analysis and model extraction methods
  • Novel implementation and simulation techniques for dealing with variability

Agenda (see the end of the page for presentation files if available)

Session 1: Infrastructure for Variability:

  • Keynote: Mark Lundstrom (Purdue University) The NEEDS Initiative: Devices, Circuits, and Systems
  • Muhammad Ashraf Alam (Purdue University) Too Hot to Handle? The Emerging Challenge of Variability/ Reliability due to Self-heating in Modern FINFET, ETSOI, and Gate-All-Around III-V Transistors
  • Tianshi Wang, Aadithya Karthik and Jaijeet Roychowdhury (UC Berkeley) The Berkeley Model and Algorithm Prototyping Platform

Session 2: Excursions in Variability:

  • Hiroyuki Matsui (University of Tokyo) Overview of Organic Transistors: From Device Physics to Applications
  • Swarup Bhunia (University of Florida) Exploiting Variability in Building Hardware Security Primitives
  • Runsheng Wang (Peking University) Understanding dynamic variability and end-of-life yield in the nanoreliability era: from devices to circuits

Session 3: Understanding Variability:

  • Afternoon Keynote: Xin Li (Carnegie Mellon University)
  • Variability Analysis and Optimization for Analog and Mixed-Signal Circuits: Challenges and Opportunities
  • Subhashish Mitra (Stanford University) Carbon Nanotube Circuits: Imperfections and Variations
  • Zheng Zhang (Argonne National Labs) and Luca Daniel (MIT) State of the Art and Recent Progress in Uncertainty Quantification for Electronic Systems

Cite this work

Researchers should cite this work as follows:

  • (2016), "8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015," https://nanohub.org/resources/23367.

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NEEDS: New Era Electronic Devices and Systems

NEEDS: New Era Electronic Devices and Systems group image

In This Workshop

  1. The NEEDS Initiative: Devices, Circuits, and Systems

    07 Jan 2016 | Presentation Materials | Contributor(s): Mark Lundstrom

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015.This presentation provides an overview of the NEEDS initiative, which is funded by the U.S. National Science Foundation and by the Semiconductor Research Corporation. The overarching...

  2. MAPP: The Berkeley Model and Algorithm Prototyping Platform

    11 Jan 2016 | Presentation Materials | Contributor(s): Tianshi Wang, Aadithya V Karthik, Jaijeet Roychowdhury

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It provides an introduction to Berkeley Model and Algorithm Prototyping Platform (MAPP). MAPP is a MATLAB-based platform that provides a complete environment for developing, testing,...

  3. Too hot to handle? The emerging challenge of reliability/variability in self-heated FintFET, ETSOI, and GAA-FET

    11 Jan 2016 | Presentation Materials | Contributor(s): Muhammad A. Alam, Sang Hoon Shin, Muhammad Abdul Wahab, Jiangjiang Gu, Jingyun Zhang, Peide "Peter" Ye

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It is difficult to control the geometry, doping, and thicknesses of small transistors. Moreover, nanoscale transistors degrade due to NBTI and HCI at vastly different...