VEDA: Amplitude Modulated Scanning

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Archive Version 1.0.1
Published on 20 May 2009, unpublished on 06 Oct 2009 All versions

doi:10.4231/D3SN0139X cite this

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Tools

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Abstract

This tool is being replaced by VEDA 2.0, which is an integrated suite of tools for simulating dynamic AFM including everything that is in this tool plus new contact models, ability to simulate liquid environments, and multiple eigenmodes. Please start to use the new tool as this one will be discontinued soon.

Credits

This work was funded by the Network for Computational Nanotechnology (NCN).

References

  • Frontiers In Scanning Probe Microscopy Workshop

    • Cite this work

    Researchers should cite this work as follows:

    • John Melcher, Shuiqing Hu, Arvind Raman, Steven Douglas Johnson, Daniel Kiracofe (2009), "VEDA: Amplitude Modulated Scanning," https://nanohub.org/resources/vedaams. (DOI: 10.4231/D3SN0139X).

      BibTex | EndNote

    Tags

    1. atomic force microscopy (AFM)
    2. instruments
    3. Nano Electro-Mechanical Systems (NEMS)
    4. NEMS/MEMS
    5. VEDA - Virtual Environment for Dynamic AFM