NACK Unit 6: Basic Characterization Techniques

By NACK Network

Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

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Abstract

This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance. Characterization includes electrical, optical, physical, and chemical approaches. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), 1 nm resolution field emission SEM, fluorescence microscopes, and Fourier transform infrared spectroscopy.

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Researchers should cite this work as follows:

  • NACK Network (2018), "NACK Unit 6: Basic Characterization Techniques," https://nanohub.org/resources/27532.

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Lecture Number/Topic Online Lecture Video Lecture Notes Supplemental Material Suggested Exercises
Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale View HTML
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The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale View HTML
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Basic Characterization Techniques View HTML
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Introduction to Scanning Electron Microscopy (SEM) View HTML
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Electron Microscopy View HTML
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Introduction to Field Emission Scanning Electron Microscopy (FESEM) View
Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale View HTML
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Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM) View
Advanced Scanning Probe Microscopy I View HTML
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Advanced Scanning Probe Microscopy II View HTML
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Sample Preparation for Powder X-ray Diffraction View
X-Ray Photoelectron Spectroscopy (XPS) View HTML
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Secondary Ion Mass Spectrometry (SIMS) View HTML
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Confocal Microscopy View HTML
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Fundamentals of Metrology and Characterization for Nanotechnology View HTML
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