This course is part of Purdue’s new “Breadth at the Edges” initiative.
This teaching is a preview of the course to be offered in the Fall of 2019
This course will provide the conceptual foundation so that a student can use modern statistical concepts and tools to analyze data generated by experiments or numerical simulation. We will also discuss principles of design of experiments so that the data generated by experiments/simulation are statistically relevant and useful. We will conclude with a discussion of analytical tools for machine learning and principle component analysis. At the end of the course, a student will be able to use a broad range of tools embedded in MATLAB and Excel to analyze and interpret their data.
- Review of Basic Statistical Concepts
- Where do data come from: Big vs. Small Data
- Collecting and Plotting Data: Principles of Robust Data Analysis
- Physical vs. Empirical Distribution
- Model Selection and Goodness of Fit
- Scaling Theory of Design of Experiments
- Statistical Theory of Design of Experiments
- Machine Learning vs. Physics-based Machine Learning
Breadth at the Edges initiative:
This course is part of a Purdue University initiative that aims to complement the expertise that students develop with the breadth at the edges needed to work effectively in today's multidisciplinary environment. These serious, short courses require few prerequisites and provide a general framework that can be filled in with self-study when needed.
Muhammad Ashraful Alam is the Jai N. Gupta Professor of Electrical Engineering at Purdue University where his research and teaching focus on physics, fundamental limits, and technology of classical and emerging semiconductor devices. From 1995 to 2003, he was with Bell Laboratories, Murray Hill, NJ, where he made fundamental contributions to the reliability physics of semiconductor devices and design of optoelectronic integrated circuits. Since joining Purdue in 2004, Dr. Alam has published over 200 papers on a broad range of topics involving biosensors, flexible electronics, reliability and solar cells. He is a fellow of IEEE, APS, and AAAS and the recipient of 2006 IEEE Kiyo Tomiyasu Award for contributions to device technology for communication systems, and 2015 SRC Technical Excellence Award for contribution to semiconductor reliability physics. Prof. Alam enjoys teaching: more than 100 thousands students worldwide have learned some aspect of semiconductor devices from his web-enabled courses.
Purdue’s ECE “Breadth at the Edges” initiative.
Cite this work
Researchers should cite this work as follows:
2279 Wang, Purdue University, West Lafayette, IN