Advanced Scanning Probe Microscopy II

By Sebastien Maeder1, NACK Network2

1. Pennsylvania State University, State College, PA 2. Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

Published on

Abstract

Outline

  • Part 1: Can be viewed here
    • Overview of Scanning Probe Techniques
    • Scanning Tunneling Microscopy
    • Atomic Force Microscopy
      • Hardware and Components
      • Tip/Sample Interactions
  • Part 2: This Lecture
      • Common Modes of Operation
      • Pitfalls and Image Artifacts
    • Example of Instrument Operation

Sponsored by

The Nanotechnology Applications and Career Knowledge (NACK) Network

Funded, in part, by a grant from the National Science Foundation. DUE 1205105

Cite this work

Researchers should cite this work as follows:

  • Sebastien Maeder, NACK Network (2018), "Advanced Scanning Probe Microscopy II," https://nanohub.org/resources/28983.

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