Advanced Scanning Probe Microscopy II
Advanced Scanning Probe Microscopy II
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1. Advanced Scanning Probe Micros…
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2. Principle of Operation
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3. Outline
33.433433433433436
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4. AFM Modes of Operation
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5. Contact Mode
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6. Contact Mode
122.18885552218886
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7. Contact Mode
183.91725058391725
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8. Noncontact Mode
346.47981314647984
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9. Tapping Mode
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10. Tapping Mode
467.5342008675342
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11. Tapping Mode
497.86453119786455
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12. Tapping Mode
544.21087754421092
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13. Amplitude and Phase Shift
612.379045712379
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14. Tapping Mode
635.03503503503509
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15. Tuning the Cantilever
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16. Tuning the Cantilever
720.82082082082081
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17. Tuning the Cantilever
752.15215215215221
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18. Approaching the Sample
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19. Approaching the Sample
849.24924924924926
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20. Scanning the Surface
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21. Tapping Mode: Amplitude
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22. Tapping Mode: Phase
953.82048715382052
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23. Phase Contrast
1012.9796463129796
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24. Example Images: Tapping Mode
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25. Outline
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26. Common Problems
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27. Image Artifacts
1257.0904237570906
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28. Outline
1453.3867200533869
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29. SPMs in The Teaching Cleanroom
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30. Example Specifications Veeco I…
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31. Innova SPM Parts
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32. Innova SPM Parts
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33. Loading a Pre-Mounted Tip
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34. Sample Preparation and Mountin…
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35. Loading the Sample
1674.8748748748749
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36. Preparing the Instrument
1693.9272605939273
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37. Laser Alignment on Cantilever
1738.9389389389389
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38. Detector Alignment
1769.7030363697031
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39. Acquiring an Image
1806.2062062062062
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40. Analyzing Data: Measurements
1860.593927260594
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41. Example: Distance Measurement
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42. Summary
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43. References
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