Birck Nanomaterials Characterization Workshop

By Neil R Dilley

Birck Nanotechnology Center, Purdue University, West Lafayette, IN

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Abstract

 

nanomaterials_characterization_workshop

 

Birck Nanotechnology Center is excited to hold a workshop in conjunction with three research-oriented companies – NT-MDT, Quantum Design, and Gatan – which supply crucial equipment at the Birck facility. The aim of the workshop is to review the measurement techniques for both newcomers and existing users, see the instruments in action, and discuss cutting edge developments in both instrumentation and research.

Sponsored by

Birck Nanotechnology Center

Cite this work

Researchers should cite this work as follows:

  • Neil R Dilley (2018), "Birck Nanomaterials Characterization Workshop," https://nanohub.org/resources/29175.

    BibTex | EndNote

Time

Location

Room 1001, Birck Nanotechnology Center, Purdue University, West Lafayette, IN

Tags

  1. characterization
  2. NCN Group - Characterization and Metrology

In This Workshop

  1. Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”

    11 Nov 2018 | Online Presentations | Contributor(s): Stanislav Leesment

    NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 1.

  2. Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes

    11 Nov 2018 | Online Presentations | Contributor(s): Stanislav Leesment

    NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 2.

  3. Surface Characterization at Nanoscale by means of AFM L1.3: Non-Resonant Oscillatory HybriD Mode

    11 Nov 2018 | Online Presentations | Contributor(s): Stanislav Leesment

    NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 3.

  4. Quantum Design L2.1: Measurement Platforms (MPMS/PPMS) and New Options

    28 Nov 2018 | Online Presentations

  5. Quantum Design L2.2: NanoMOKE and Ferromagnetic Resonance (phaseFMR and CryoFMR)

    28 Nov 2018 | Online Presentations

  6. Nanotechnology and Surface Science Applications

    27 Nov 2018 | Online Presentations | Contributor(s): Dmitry Zemlyanov

    Surface Characterization Facility at Birck Nanotechnology Center, BRK 1077

  7. Quantum Design L2.3: Nanolithography (Nanofrazor, Newmicra, and MicroWriter ML3)

    28 Nov 2018 | Online Presentations

    Nanolithography with Nanofrazor: thermal Scanning Probe Microscopy, Direct write laser lithography: ML3 series, and Software and Hardware add ons for EBL: NeoMicra

  8. Quantum Design L2.4: AFSEM (AFM in SEM), Single Photon Detectors, Quantum Optics Tools and Cryogenic Magneto Optical Platform

    28 Nov 2018 | Online Presentations

    Correlative Microscopy with the AFSEM: (AFM in SEM), Single Photon Detectors and Counting Electronics (SNSPD), Educational Tools for Quantum Optics (qutools), and Cyrogenic Magneto Optical Platform (OptiCool)