OOF2

By Stephen Langer1; R. Edwin García2; Andrew Reid1

1. NIST 2. Purdue University

Image based finite element analysis tool for material microstructures

Launch Tool

You must login before you can run this tool.

Version 2.3.0 - published on 27 Oct 2023

doi:10.21981/F3Y7-A242 cite this

Open source: license | download

View All Supporting Documents

Category

Tools

Published on

Abstract

OOF2 is public domain finite element analysis software created at the National Institute of Standards and Technology (NIST) to investigate the properties of microstructures. At the simplest level, OOF2 is designed to understand the effects of far fields (boundary conditions) on the local microstructural fields, or to assess the mechanical, electrical, and thermal reliability of a material with a complex topology. OOF2 allows the user to study the thermal, electrical, and stress fields in a microstructure, along with couplings such as piezoelectricity, pyroelectricity, and thermal expansion. OOF2 can also perform crystallographic analyses of polycrystalline materials by using tensor form material properties. The inputs necessary to perform a simulation include: 1) a microstructure (real micrograph or computer generated), 2) material properties and 3) boundary conditions. The specified information enables OOF2 to simulate the multiphysical properties, thus allowing to analyze and engineer the effect of microstructure. The figures below show 1) the input image, a lamellar directionally solidified eutectic of NiO and yttria-stabilized ZrO2,  2) a zoomed in view of the mesh, and 3) the stresses developed in the microstructure due to an temperature increase.

NOTE: Version 2.3.0 introduces some major changes.  Please see the OOF2 change log for the details.  In particular, some of the Skeleton modification tools have changed.  Please contact the OOF2 developers if you need assistance converting scripts to the new format.

You can still run OOF2 2.2.3 if you encounter difficulties with 2.3.0.  

screencapture

*Images from: S.A. Langer, E.R. Fuller, Jr. and W.C. Carter, OOF: an image-based finite-element analysis of material microstructures. Comput Sci Eng 3 3 (2001), pp. 15–23.

Credits

Source Code By: Steve Langer Andrew Reid Edwin Garcia Rhonald C. Lua Valerie Coffman Ed Fuller

Cite this work

Researchers should cite this work as follows:

  • Stephen Langer, R. Edwin García, Andrew Reid (2023), "OOF2," https://nanohub.org/resources/oof2. (DOI: 10.21981/F3Y7-A242).

    BibTex | EndNote

Tags