Schred: Exercise 3

By Dragica Vasileska1, Gerhard Klimeck2

1. Arizona State University 2. Purdue University

Published on


This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates.



Sponsored by


Cite this work

Researchers should cite this work as follows:


  • Dragica Vasileska, Gerhard Klimeck (2008), "Schred: Exercise 3,"

    BibTex | EndNote