Schred: Exercise 3

By Dragica Vasileska1; Gerhard Klimeck2

1. Arizona State University 2. Purdue University

Published on

Abstract

This exercise examines the degradation of the total gate capacitance with technology generation due to Maxwell-Boltzmann instead of Fermi-Dirac statistics, quantum-mechanical charge description and depletion of the polysilicon gates.

 

 

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NSF

Cite this work

Researchers should cite this work as follows:

  • www.eas.asu.edu/~vasilesk

  • Dragica Vasileska, Gerhard Klimeck (2008), "Schred: Exercise 3," https://nanohub.org/resources/4904.

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