MSE 640 Transmission Electron Microscopy and Crystalline Imperfections
25 Feb 2008 | Courses | Contributor(s): Eric Stach
Overview of Computational Nanoscience: a UC Berkeley Course
01 Feb 2008 | Courses | Contributor(s): Jeffrey C Grossman, Elif Ertekin
This course will provide students with the fundamentals of computational problem-solving techniques that are used to understand and predict properties of nanoscale systems. Emphasis will be placed on how to use simulations effectively, intelligently, and cohesively to predict properties that...
MSE 376 Nanomaterials
24 Oct 2006 | Courses | Contributor(s): Mark Hersam
"Nanomaterials," is an interdisciplinary introduction to processing, structure, and properties of materials at the nanometer length scale. The course will cover recent breakthroughs and assess the impact of this burgeoning field. Specific nanofabrication topics include epitaxy, beam...
Illinois MATSE 280: Introduction to Engineering Materials
18 Aug 2008 | Courses | Contributor(s): Duane Douglas Johnson
This course introduces you to the materials science and engineering of metals, ceramics, polymers, and electronic materials. Topics include: bonding, crystallography, imperfections, phase diagrams, properties and processing of materials. Case studies are used when appropriate to exemplify the...
MSE 582 Transmission Electron Microscopy Skills
28 Jan 2008 | Courses | Contributor(s): Eric Stach
Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.
Illinois MatSE485/Phys466/CSE485 - Atomic-Scale Simulation
27 Jan 2009 | Courses | Contributor(s): David M. Ceperley
THE OBJECTIVE is to learn and apply fundamental techniques used in (primarily classical) simulations in order to help understand and predict properties of microscopic systems in materials science, physics, chemistry, and biology. THE EMPHASIS will be on connections between the simulation results...