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Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.1 - published on 22 Jan 2014

doi:10.4231/D3FQ9Q555 cite this

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Citations Non-affiliated (1) | Affiliated (2)

Non-affiliated authors

Affiliated authors, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.