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Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.1 - published on 22 Jan 2014

doi:10.4231/D3FQ9Q555 cite this

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Version Released DOI Handle Published
2.1 22 Jan 2014 doi:10.4231/D3FQ9Q555 yes
2.0 08 Mar 2010 doi:10.4231/D30G3GX8V no
1.1.1 19 Oct 2009 doi:10.4231/D3183424T no
1.1 12 Feb 2008 doi:10.4231/D35X25C2Q no
1.0 26 Jun 2006 doi:10.4231/D39K45S34 no, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.