Modeling Interface-defect Generation (MIG)

Analyzes device reliability based on NBTI

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Version 2.1 - published on 22 Jan 2014

doi:10.4231/D3FQ9Q555 cite this

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Versions

Version Released DOI Handle Published
2.1 22 Jan 2014 doi:10.4231/D3FQ9Q555 yes
2.0 08 Mar 2010 doi:10.4231/D30G3GX8V no
1.1.1 19 Oct 2009 doi:10.4231/D3183424T no
1.1 12 Feb 2008 doi:10.4231/D35X25C2Q no
1.0 26 Jun 2006 doi:10.4231/D39K45S34 no