You must login before you can run this tool.
This tool was developed mainly to provide a quick analysis resource for XPS experiments involving graphene flakes or films of different thicknesses. Given sets of data from the experiment as indicated in the manual for this tool, it can provide the number of monolayers not only for graphene flakes, but other thin film materials.
Researchers should cite this work as follows:
- RAPPTURE, NIST Database #71 and #82, CasaXPS. Refer to manual for detailed citations.