Tags: AFM

All Categories (1-20 of 21)

  1. AFM And EBSD Cross-Comparison Analysis Tool

    14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie

    Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...

  2. Highly Oriented Pyrolytic Graphite (HOPG) to buy

    31 Aug 2017 | Posted by TipsNano Co

    Company TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG).  It's a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force...

    https://nanohub.org/members/173066/blog/2017/08/highly-oriented-pyrolytic-graphite-hopg-to-buy

  3. All Types of AFM Probes‎ - AFM Probes, AFM Cantilever, AFM Tips, AFM Cantilevers, AFM Cantilever Types, AFM, Probes, TipsNano, TipsNano webshop

    15 Jun 2017 | Posted by TipsNano Co

    Start saving with TipsNano’s newest line of high-quality, low cost probes. Whether you’re an academic research institution looking for the most affordable probe available, or a...

    https://nanohub.org/members/173066/blog/2017/06/all-types-of-afm-probes---afm-probes-afm-cantilever-afm-tips-afm-cantilevers-afm-cantilever

  4. Learning Module: Microcantilevers - Instructor Materials

    09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)

    ­This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology.  These are the instructor materials.

  5. Learning Module: Microcantilevers

    09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)

    This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation.  There is a pre and post-test, four (4) informational units (PKs), and two (2)...

  6. High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control

    19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo

    Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...

  7. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  8. Jhon Pazos Alonso

    https://nanohub.org/members/145014

  9. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach

  10. [Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm

    19 Nov 2015 | | Contributor(s):: Emad Moeendarbary

  11. Apr 01 2015

    Workshop on Nanoindentation and Its Applications in Mechanotransduction and Characterization of Soft Materials

    Characterizing the mechanical properties of materials using indentation has been around for centuries. It was only recently that it emerged as a technique of choice for characterizing soft and...

    https://nanohub.org/events/details/1125

  12. Kathy Walsh

    https://nanohub.org/members/119508

  13. shuai shi

    https://nanohub.org/members/112841

  14. MATLAB-based blind tip reconstruction algorithms

    01 Aug 2014 | | Contributor(s):: Erin Flater, Charles Clifford

    We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of...

  15. Rafael Benitez

    https://nanohub.org/members/99976

  16. Sasha Denisin

    I am working with Prof Beth Pruitt's microsystems lab to study the biophysical underpinnings of cell-cell & cell-substrate interactions. I aim to use using microscale fabrication techniques &...

    https://nanohub.org/members/85315

  17. Alok Ranjan

    https://nanohub.org/members/71877

  18. Near-field radiative heat transfer and Casimir Force Measurement

    30 May 2012 | | Contributor(s):: Joel Chevrier

    This presentation first makes a simple introduction on how the charge fluctuations give rises to these effects that are nowadays most effectively detected using MEMS or AFM technologies. This will lead to question the relevance of these effects in the use of MEMS. After description of our...

  19. Nanoscale Spectroscopy and Plasmonics in Infrared

    19 Apr 2012 | | Contributor(s):: Mikhail Belkin

    In this talk, I will present the results of two of our research projects. I will start with a simple technique for nanoscale mid-infrared spectroscopy that we have developed recently. Subwavelength resolution is achieved by detecting optical absorption through measuring local photothermal...

  20. Tejasvi Parupudi S V R V

    Graduate Student working on AFM. Interested in BioMEMS, medical devices.

    https://nanohub.org/members/57433