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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Carbon Nanotube Counter
08 Aug 2018 | Contributor(s):: Quinn Lennemann
Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...
Jul 25 2016
International Conference on Non-Contact Atomic Force Microscopy
Bogdan Mihai Neamtu
Structure and Morphology of Silicon-Germanium Thin Films
07 Feb 2015 | Contributor(s):: Brian Demczyk
This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...
Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...
Aaron Jay Hoover
Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | | Contributor(s):: Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...
Texture-Induced hcp c-axis Alignment in Longitudinal Media
15 Jul 2013 | | Contributor(s):: Brian Demczyk
This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.
[Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy
29 Dec 2012 | | Contributor(s):: Peter So
Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...