Tags: atomic force microscopy (AFM)

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. Nanotechnology Workshops at Northwest Vista College - Nanotechnology Workshop for High School Students and High School Educators

    26 Oct 2020 | | Contributor(s):: Neda Habibi, Jared Ashcroft (editor)

    Northwest Vista College will host it’s fourth summer Nanotechnology workshop for high school students and high school educators in summer 2021. ...

  2. Jonathan Patricio

    https://nanohub.org/members/304315

  3. Uzair Iqbal

    Currently, I am a PhD Student in Department of Mechanical Engineering, IISc, Bangalore. I completed my B.Tech in Mechanical Engineering from NIT-Trichy in 2019. I had my schooling done in Aligarh...

    https://nanohub.org/members/295023

  4. Sourav Sahoo

    https://nanohub.org/members/281706

  5. NNCI Outreach Demonstration Guide

    10 Feb 2020 | | Contributor(s):: Nancy Healy, NNCI Nano

    This compendium of demonstrations includes 17 activities that can be used to demonstrate topics to students and the general public.  They are useful for science festivals, family science nights, and science cafes.  ...

  6. Quantum-Enhanced Imaging for Advanced Characterization

    21 Jan 2020 | | Contributor(s):: Raphael C. Pooser

  7. CDs and DVDs as Diffraction Gratings

    13 Jan 2020 | | Contributor(s):: Rama Balachandran, Karen Porter Davis, NNCI Nano

    The objective of this lab is to compare the diffraction behavior of light waves between a CD and DVD. CDs and DVDs contain regularly spaced micrometer sized features which can act like a diffraction grating. Using commercial electronic storage devices like CDs and DVDs as gratings rather than...

  8. Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects

    06 Jan 2020 | | Contributor(s):: Samantha Andrews, NNCI Nano

    Students will explore the storage capacities of CDs, DVDs, and Blu-ray discs using an Atomic Force Microscope (AFM). The AFM allows us to image objects that are extremely small in size, often on the nanoscale (10-9m). Students will access an AFM via Remotely Accessible Instruments for...

  9. Paven Thomas Mathew

    https://nanohub.org/members/264875

  10. Fundamentals of Metrology and Characterization for Nanotechnology

    13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network

    Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it

  11. 3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool

    31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec

    This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic

  12. Bryan Auxier

    https://nanohub.org/members/215608

  13. Marcus Böhm

    https://nanohub.org/members/209984

  14. Advanced Scanning Probe Microscopy I

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  15. Advanced Scanning Probe Microscopy II

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  16. AFM And EBSD Cross-Comparison Analysis Tool

    14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie

    Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...

  17. Carbon Nanotube Counter

    08 Aug 2018 | | Contributor(s):: Quinn Lennemann

    Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...

  18. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  19. Himanshu Patel

    https://nanohub.org/members/198194

  20. Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics

    08 Dec 2017 | | Contributor(s):: Roger Proksch

    In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...