Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Nanotechnology Workshops at Northwest Vista College - Nanotechnology Workshop for High School Students and High School Educators
26 Oct 2020 | | Contributor(s):: Neda Habibi, Jared Ashcroft (editor)
Northwest Vista College will host it’s fourth summer Nanotechnology workshop for high school students and high school educators in summer 2021. ...
NNCI Outreach Demonstration Guide
10 Feb 2020 | | Contributor(s):: Nancy Healy, NNCI Nano
This compendium of demonstrations includes 17 activities that can be used to demonstrate topics to students and the general public. They are useful for science festivals, family science nights, and science cafes. ...
Quantum-Enhanced Imaging for Advanced Characterization
21 Jan 2020 | | Contributor(s):: Raphael C. Pooser
CDs and DVDs as Diffraction Gratings
13 Jan 2020 | | Contributor(s):: Rama Balachandran, Karen Porter Davis, NNCI Nano
The objective of this lab is to compare the diffraction behavior of light waves between a CD and DVD. CDs and DVDs contain regularly spaced micrometer sized features which can act like a diffraction grating. Using commercial electronic storage devices like CDs and DVDs as gratings rather than...
Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects
06 Jan 2020 | | Contributor(s):: Samantha Andrews, NNCI Nano
Students will explore the storage capacities of CDs, DVDs, and Blu-ray discs using an Atomic Force Microscope (AFM). The AFM allows us to image objects that are extremely small in size, often on the nanoscale (10-9m). Students will access an AFM via Remotely Accessible Instruments for...
Paven Thomas Mathew
Fundamentals of Metrology and Characterization for Nanotechnology
13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool
31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec
This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic
Advanced Scanning Probe Microscopy I
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
Advanced Scanning Probe Microscopy II
OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
AFM And EBSD Cross-Comparison Analysis Tool
14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie
Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...
Carbon Nanotube Counter
08 Aug 2018 | | Contributor(s):: Quinn Lennemann
Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...
The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale
20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network
OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves
Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics
08 Dec 2017 | | Contributor(s):: Roger Proksch
In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...