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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Structure and Morphology of Silicon-Germanium Thin Films
07 Feb 2015 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were...
Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing...
Texture-Induced hcp c-axis Alignment in Longitudinal Media
15 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining...
Images for AFM
17 Feb 2009 | Presentation Materials | Contributor(s): yan zhang
Determining the Mechanics of Living Cells by Atomic Force Microscopy
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21 Apr 2004 | Presentation Materials | Contributor(s): Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings