Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (1-20 of 110)

  1. Carbon Nanotube Counter

    08 Aug 2018 | Contributor(s):: Quinn Lennemann

    Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...

  2. Structure and Morphology of Silicon-Germanium Thin Films

    07 Feb 2015 | Contributor(s):: Brian Demczyk

    This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...

  3. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...

  4. Structure and Morphology of Silicon Germanium Thin Films

    30 Dec 2013 | | Contributor(s):: Brian Demczyk

    Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...

  5. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | | Contributor(s):: Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

  6. [Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy

    29 Dec 2012 | | Contributor(s):: Peter So

    Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...

  7. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    26 Oct 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...

  8. VEDA First-time User Manual

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple examples, the user is referred to the comprehensive manual for a more detailed description and additional...

  9. VEDA Manual

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.

  10. VEDA: Virtual Environment for Dynamic AFM

    30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu

    A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.

  11. BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    02 Dec 2011 | | Contributor(s):: Helen McNally

    Guest lecturer: Helen McNally

  12. Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang

    17 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim

    Local raster scanning of high speed imaging of polymers in atomic force microscopy.

  13. Base Motion Calculations

    17 Jun 2011 | | Contributor(s):: Daniel Kiracofe

    Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011

  14. Introduction to Birck Scanning Probe Microscopy Center

    21 Mar 2011 | | Contributor(s):: Xin Xu

    This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.

  15. Asylum Research Atomic Force Microscopy (AFM) Workshop

    21 Mar 2011 |

    This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.

  16. Atomic Force Microscopy: Applications for Life Science Research

    21 Mar 2011 | | Contributor(s):: Irene Revenko

    This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...

  17. Force Measurements in AFM

    21 Mar 2011 | | Contributor(s):: Amir Moshar

  18. AFM Metrology of Cellulose Nanocrystals

    21 Mar 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.

  19. Electronic Characterization of Materials Using Conductive AFM

    21 Mar 2011 | | Contributor(s):: Amir Moshar

  20. AFM Sample Preparation in Biology

    22 Mar 2011 | | Contributor(s):: Irene Revenko

    All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...