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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Structure and Morphology of Silicon-Germanium Thin Films
07 Feb 2015 | Contributor(s):: Brian Demczyk
This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...
Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...
Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | | Contributor(s):: Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...
Texture-Induced hcp c-axis Alignment in Longitudinal Media
15 Jul 2013 | | Contributor(s):: Brian Demczyk
This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.
[Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy
29 Dec 2012 | | Contributor(s):: Peter So
Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...
VEDA First-time User Manual
07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman
This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple examples, the user is referred to the comprehensive manual for a more detailed description and additional...
This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.
VEDA: Virtual Environment for Dynamic AFM
30 May 2012 | | Contributor(s):: Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu
A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | | Contributor(s):: Helen McNally
Guest lecturer: Helen McNally
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
17 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Base Motion Calculations
17 Jun 2011 | | Contributor(s):: Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
Introduction to Birck Scanning Probe Microscopy Center
21 Mar 2011 | | Contributor(s):: Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
Asylum Research Atomic Force Microscopy (AFM) Workshop
21 Mar 2011 |
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Atomic Force Microscopy: Applications for Life Science Research
21 Mar 2011 | | Contributor(s):: Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...
Force Measurements in AFM
21 Mar 2011 | | Contributor(s):: Amir Moshar
AFM Metrology of Cellulose Nanocrystals
21 Mar 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
Electronic Characterization of Materials Using Conductive AFM
AFM Sample Preparation in Biology
22 Mar 2011 | | Contributor(s):: Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...
ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details
22 Nov 2010 | | Contributor(s):: Ron Reifenberger