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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction
12 Oct 2010 | | Contributor(s):: Ashlie Martini
This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on the...
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
AFM Sample Preparation in Biology
03 May 2011 | | Contributor(s):: Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...
Asylum Research Atomic Force Microscopy (AFM) Workshop
03 May 2011 |
This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.
Atomic Force Microscopy
out of 5 stars
01 Dec 2005 | | Contributor(s):: Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...
Atomic Force Microscopy: Applications for Life Science Research
21 Mar 2011 | | Contributor(s):: Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...
Base Motion Calculations
17 Jun 2011 | | Contributor(s):: Daniel Kiracofe
Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | | Contributor(s):: Helen McNally
Guest lecturer: Helen McNally
BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
30 Sep 2007 | | Contributor(s):: Helen McNally
What Helen McNally as guest lecturer.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | | Contributor(s):: Don Bergstrom
Carbon Nanotube Counter
08 Aug 2018 | | Contributor(s):: Quinn Lennemann
Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...
Determining the Mechanics of Living Cells by Atomic Force Microscopy
21 Apr 2004 | | Contributor(s):: Emilie Grzywa Rexeisen
2003 SURI Conference Proceedings
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
Electronic Characterization of Materials Using Conductive AFM
21 Mar 2011 | | Contributor(s):: Amir Moshar
Force Measurements in AFM
Frontiers in Scanning Probe Microscopy
30 Nov 2006 |
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are...
Gas Damping of Microcantilevers at Low Ambient Pressures
03 Nov 2008 | | Contributor(s):: Rahul Anil Bidkar
This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a...
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
29 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.