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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
ME 597 Teaching Materials: Homeworks (Fall 2010)
18 Oct 2010 | Series | Contributor(s): Ron Reifenberger, Arvind Raman
Homework materials for the Fall 2010 teaching of ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy.