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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (1-20 of 127)

  1. Bogdan Mihai Neamtu

    https://nanohub.org/members/134289

  2. Heon-Yul Ryu

    https://nanohub.org/members/134189

  3. Kathy Walsh

    https://nanohub.org/members/119508

  4. Structure and Morphology of Silicon-Germanium Thin Films

    07 Feb 2015 | Presentation Materials | Contributor(s): Brian Demczyk

    This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were...

    https://nanohub.org/resources/21913

  5. Tianmao Lai

    https://nanohub.org/members/109578

  6. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing...

    https://nanohub.org/resources/20737

  7. Aaron Jay Hoover

    https://nanohub.org/members/94669

  8. Structure and Morphology of Silicon Germanium Thin Films

    30 Dec 2013 | Papers | Contributor(s): Brian Demczyk

    Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum...

    https://nanohub.org/resources/20123

  9. Ashish Chanana

    https://nanohub.org/members/85959

  10. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

    https://nanohub.org/resources/18917

  11. [Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy

    29 Dec 2012 | Online Presentations | Contributor(s): Peter So

    Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate...

    https://nanohub.org/resources/16156

  12. Amin Vakhshouri

    I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research...

    https://nanohub.org/members/73806

  13. Tewfik Souier

    https://nanohub.org/members/73657

  14. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining...

    https://nanohub.org/resources/15606

  15. Filippo Mangolini

    https://nanohub.org/members/71694

  16. Brad Weedon

    https://nanohub.org/members/69741

  17. VEDA First-time User Manual

    07 Aug 2012 | Teaching Materials | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple...

    https://nanohub.org/resources/14936

  18. VEDA Manual

    07 Aug 2012 | Teaching Materials | Contributor(s): John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This is a comprehensive manual for the VEDA (VIRTUAL ENVIRONMENT FOR DYNAMIC AFM) Version 2.0 simulation tool.

    https://nanohub.org/resources/14934

  19. Nano fundao

    Nanotechnology student 3rd year.

    https://nanohub.org/members/69058

  20. VEDA: Virtual Environment for Dynamic AFM

    30 May 2012 | Tools | Contributor(s): Daniel Kiracofe, John Melcher, Arvind Raman, Sudharsan Balasubramaniam, Steven Douglas Johnson, Shuiqing Hu

    A suite of dynamic AFM simulators for air/liquid/vacuum on soft or hard samples.

    https://nanohub.org/resources/veda

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