Tags: atomic force microscopy

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (1-20 of 130)

  1. Carbon Nanotube Counter

    08 Aug 2018 | Contributor(s):: Quinn Lennemann

    Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...

  2. Himanshu Patel

    https://nanohub.org/members/198194

  3. Jul 25 2016

    International Conference on Non-Contact Atomic Force Microscopy

    NC-AFM 2016 will be held at the East Midlands Conference Centre at the University of Nottingham and is the 19th conference in the International Non-contact Atomic Force Microscopy (NC-AFM)...

    https://nanohub.org/events/details/1466

  4. Bogdan Mihai Neamtu

    https://www.linkedin.com/profile/view?id=AAIAAApgIH8BjDdkIuCzTZsuJkYAtcSLwNBoBRA&trk=nav_responsive_tab_profile

    https://nanohub.org/members/134289

  5. Heon-Yul Ryu

    https://nanohub.org/members/134189

  6. Kathy Walsh

    https://nanohub.org/members/119508

  7. Structure and Morphology of Silicon-Germanium Thin Films

    07 Feb 2015 | Contributor(s):: Brian Demczyk

    This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...

  8. Tianmao Lai

    https://nanohub.org/members/109578

  9. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...

  10. Aaron Jay Hoover

    https://nanohub.org/members/94669

  11. Structure and Morphology of Silicon Germanium Thin Films

    30 Dec 2013 | | Contributor(s):: Brian Demczyk

    Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...

  12. Ashish Chanana

    https://nanohub.org/members/85959

  13. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | | Contributor(s):: Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

  14. [Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy

    29 Dec 2012 | | Contributor(s):: Peter So

    Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...

  15. Amin Vakhshouri

    I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research involved...

    https://nanohub.org/members/73806

  16. Tewfik Souier

    https://nanohub.org/members/73657

  17. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    26 Oct 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...

  18. Filippo Mangolini

    https://nanohub.org/members/71694

  19. Brad Weedon

    https://nanohub.org/members/69741

  20. VEDA First-time User Manual

    07 Aug 2012 | | Contributor(s):: John Melcher, Daniel Kiracofe, Shuiqing Hu, Steven Douglas Johnson, Sudharsan Balasubramaniam, Arvind Raman

    This document is intended to be a “quickstart” guide to get new users running their first simulations with VEDA, walking the user through two easy examples. After completing these simple examples, the user is referred to the comprehensive manual for a more detailed description and additional...