Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Blogs (1-2 of 2)

  1. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    Blog | 19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  2. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    Blog | 04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach